X-Ray Diffraction by Disordered Lamellar Structures

Editorial: Springer Berlin Heidelberg Fecha de lanzamiento: 2012-12-06

Descripción

New methods for the determination of the nature, proportion, and distribution of structural defects in microcrystallized lamellar systems are of utmost importance not only to experimentalists but also to theoreticians. Mathematical formalism - indispensable for such analyses - is well-illustrated by various examples, allowing this method to be easily adopted and even to be applied to other solids with lamellar or pseudo-lamellar structures.

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Información adicional

Tipo: Mineralogy & gems

Colección: Springer

Tipo: Adobe PDF

ISBN: 9783642748028

Información adicional

Tipo: Mineralogy & gems

Colección: Springer

Tipo: Adobe PDF

ISBN: 9783642748028

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